[PDF.21ay] Novel Algorithms for Fast Statistical Analysis of Scaled Circuits (Lecture Notes in Electrical Engineering)

Novel Algorithms for Fast Statistical Analysis of Scaled Circuits (Lecture Notes in Electrical Engineering)

[PDF.me60] Novel Algorithms for Fast Statistical Analysis of Scaled Circuits (Lecture Notes in Electrical Engineering)

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 | #7999040 in Books |  2009-08-07 | Original language:English | PDF # 1 |  9.21 x.50 x6.14l,1.05 | File type: PDF | 195 pages

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|| ||The Statistical Blockade method proposed by Singhee and Rutenbar will make a significant impact on the design of next-generation digital integrated circuits. It has the potential to dramatically reduce simulation time compared to a traditional Monte Carlo app

As VLSI technology moves to the nanometer scale for transistor feature sizes, the impact of manufacturing imperfections result in large variations in the circuit performance. Traditional CAD tools are not well-equipped to handle this scenario, since they do not model this statistical nature of the circuit parameters and performances, or if they do, the existing techniques tend to be over-simplified or intractably slow. Novel Algorithms for Fast Statistical Analysis of...

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