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Journey to Data Quality (MIT Press)
Yang W. Lee, Leo L. Pipino, Richard Y. Wang, James D. Funk
[PDF.mu10] Journey to Data Quality (MIT Press)
Journey to Data Quality Yang W. Lee, Leo L. Pipino, Richard Y. Wang, James D. Funk epub Journey to Data Quality Yang W. Lee, Leo L. Pipino, Richard Y. Wang, James D. Funk pdf download Journey to Data Quality Yang W. Lee, Leo L. Pipino, Richard Y. Wang, James D. Funk pdf file Journey to Data Quality Yang W. Lee, Leo L. Pipino, Richard Y. Wang, James D. Funk audiobook Journey to Data Quality Yang W. Lee, Leo L. Pipino, Richard Y. Wang, James D. Funk book review Journey to Data Quality Yang W. Lee, Leo L. Pipino, Richard Y. Wang, James D. Funk summary
| #397671 in Books | 2009-08-21 | Original language:English | PDF # 1 | 9.00 x.55 x6.00l,.70 | File type: PDF | 240 pages||||The issue of data quality has become increasingly important over the last decade as the amount of data being collected and stored continues to increase at a rapid rate. These researchers have been at the forefront of understanding the impact and implication o
All organizations today confront data quality problems, both systemic and structural. Neither ad hoc approaches nor fixes at the systems leve -- installing the latest software or developing an expensive data warehouse -- solve the basic problem of bad data quality practices. Journey to Data Quality offers a roadmap that can be used by practitioners, executives, and students for planning and implementing a viable data and information quality management program. ...
You can specify the type of files you want, for your device.Journey to Data Quality (MIT Press) | Yang W. Lee, Leo L. Pipino, Richard Y. Wang, James D. Funk. A good, fresh read, highly recommended.
